Optical Profilometry (Computers - Information Technologies)

Item ID 132671633 in Category: Computers - Information Technologies

Optical Profilometry
Optical Profilometry Testing Optical Profilometry (OP) or White Light Interferometry (WLI) is an interferometric-based non-contact technology for the measurement of surface topography. It is used to measure surface roughness, coating thickness variation, flatness, surface curvature, texture, and thin-film coating stress. It’s a non-destructive and relatively fast method with a wide range of applications. A diamond stylus is scanned on the sample’s surface in a contact mode profilometer while its vertical movement is recorded. In contrast, a non-contact mode profilometer uses a laser or optical beam. The light beam is split with one half directed to the surface and another half to the mirror. When these beams are recombined, the wavelength scale path difference produced by the topography variations causes interference. Contour information is extrapolated from the interpretation of the interference patterns. An optical profiler can be useful in a wide range of scientific and industrial examination disciplines. It is possible to measure surface forms over wider areas using devices with lesser spatial resolution. INFINITA LAB
Related Link: Click here to visit item owner's website (1 hit)

Target State: New Jersey Target City : Newark Last Update : Aug 14, 2023 11:29 AM Number of Views: 78	Item Owner : Infinita lab Contact Email: Contact Phone: 08888783090

Friendly reminder: Click here to read some tips.

2024-06-10 (0.385 sec)